异质结
材料科学
光电子学
光电探测器
化学气相沉积
整改
半导体
范德瓦尔斯力
单层
基质(水族馆)
吸收(声学)
激子
金属有机气相外延
纳米技术
量子阱
比探测率
电子
薄膜
石墨烯
量子效率
作者
Shaoxiang Liu,Xianxiao Liang,Yang Zhao,Yonghui Zou,X. L. Sun,Xueyi Deng,Li‐Jun Wan,Zeyun Xiao,Shuanglong Feng,Xuan Shi,Hongquan Zhao
标识
DOI:10.1002/adom.202501146
摘要
Abstract Transition metal dichalcogenides van der Waals (vdW) heterojunctions have important potential applications for the development of novel optoelectronic devices due to their unique structures and physical properties. However, it's inevitable to introduce pollutants during the preparation process of the heterojunction and device. Herein, 13.8at% of Yb‐doped monolayer WS 2 (WS 2 (Yb) is synthesized on a B‐doped Si/SOI substrate to form WS 2 (Yb)/Si vdW heterojunctions using one‐step chemical vapor deposition (CVD) technique. The heterojunction device with an ultraclean interface is directly fabricated via the inkjet printing system. Density functional theory (DFT) calculations based on the WS 2 (Yb)/Si heterojunction are performed, implying a type‐II band arrangement, which is conducive to the separation of electrons and holes. The absorption range of the heterojunction is expanded and enhanced to the short‐infrared of 2500 nm. Both semiconductors are theoretically predicted to be p‐type, and the carrier transport behaviors are consistent with the experimental results. Under a 635 nm monochromatic light illumination, the WS 2 (Yb)/Si photodetector demonstrates 36.81 A W −1 of responsivity, 7203.59% of external quantum efficiency, 2.15 × 10 12 Jones of specific detectivity, 10 3 of rectification ratio, and 10 4 of photo‐to‐dark current ratio, respectively, indicating excellent optoelectronic performance. This provides a strategy to accelerate the development of 2D silicon‐based semiconductor integration.
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