位错
材料科学
Burgers向量
电子背散射衍射
凝聚态物理
皮尔斯应力
衍射
应力场
表征(材料科学)
位错蠕变
光学
结晶学
复合材料
物理
微观结构
纳米技术
有限元法
化学
热力学
作者
C. Ernould,V. Taupin,B. Beausir,J.J. Fundenberger,N. Maloufi,J. Guyon,E. Bouzy
标识
DOI:10.1016/j.matchar.2022.112351
摘要
A nanopipe threading screw dislocation in a GaN layer is studied. A recently developed high-angular resolution electron backscatter diffraction technique, relying on a global image registration of Kikuchi patterns, is used to assess elastic strain and rotation fields in the defected area. The characterization is complemented with predictions from a piezoelectric field dislocation mechanics model of a threading screw dislocation line. In plane elastic fields are obtained at the free surface, which arise from the cancellation of the dislocation bulk shear stress field. The experimental and simulated long range fields agree qualitatively well and correspond to a screw dislocation with Burgers vector magnitude 3c = 1.56 nm. • HR-EBSD measurements of elastic strains and rotations in GaN single crystal. • Nanopipe screw dislocation. • Field Dislocation Mechanics Modelling. • Good qualitative agreement between HR-EBSD measurements and simulation results.
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