材料科学
锗
锡
光致发光
碳纤维
拉曼光谱
碳化物
带隙
分子束外延
硅
无定形碳
无定形固体
光电子学
宽禁带半导体
纳米技术
外延
光学
化学
结晶学
冶金
复合材料
图层(电子)
物理
复合数
作者
Md. Shamim Reza,Tuhin Dey,Augustus W. Arbogast,Aaron J. Muhowski,M. Holtz,Chad A. Stephenson,Seth R. Bank,Daniel Wasserman,Mark A. Wistey
摘要
Direct bandgap group IV materials could provide intimate integration of lasers, amplifiers, and compact modulators within complementary metal–oxide–semiconductor for smaller, active silicon photonics. Dilute germanium carbides (GeC) with ∼1 at. % C offer a direct bandgap and strong optical emission, but energetic carbon sources such as plasmas and e-beam evaporation produce defective materials. In this work, we used CBr4 as a low-damage source of carbon in molecular beam epitaxy of tin-free GeC, with smooth surfaces and narrow x-ray diffraction peaks. Raman spectroscopy showed substitutional incorporation of C and no detectable sp2 bonding from amorphous or graphitic carbon, even without surfactants. Photoluminescence shows strong emission compared with Ge.
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