X射线光电子能谱
砷
结合能
化学
吸附
X射线
无机化学
分析化学(期刊)
物理化学
环境化学
化学工程
原子物理学
量子力学
物理
工程类
有机化学
作者
Friederike C. Lange,H. Schmelz,Helmut Knözinger
标识
DOI:10.1016/0368-2048(91)80017-o
摘要
XPS binding energies for the 3d levels of As5+ and As3+ have been determined to be 46.0 ± 0.17 eV and 44.6 ± 0.13 eV respectively, for oxides of arsenic being adsorbed on titania. When As2O3 is deposited on titania from the vapour phase it is oxidized to form As5+ species, probably orthoarsenate (V) species which replace OH groups on the titania surface. An X-ray induced reduction of these pentavalent As surface species during XPS data acquisition was observed.
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