材料科学
锑
可靠性(半导体)
极限抗拉强度
温度循环
焊接
合金
半导体
冶金
复合材料
功率(物理)
光电子学
热的
热力学
物理
作者
Akira Morozumi,Hiroaki Hokazono,Yoshitaka Nishimura,Eiji Mochizuki,Yoshikazu Takahashi
出处
期刊:Transactions of The Japan Institute of Electronics Packaging
[Japan Institute of Electronics Packaging]
日期:2015-01-01
卷期号:8 (1): 8-17
被引量:23
摘要
Power semiconductor devices for electric power conversion must be able to operate at high temperatures and with high levels of reliability. Therefore, heat resistance and long fatigue lifetime are necessary for the solder joints of these devices. In this paper, we discuss the mechanical properties and the thermal cycling lifetime evaluation of a Sn-Sb binary alloy whose melting temperature can be controlled relatively, and which has excellent high temperature properties. Tensile tests are conducted to determine how the reliability of solder joints using the Sn-Sb alloy is affected by the amount of Sb. We used a Sn-13 wt.% Sb binary alloy as the joint material of a power semiconductor device and investigated the thermal cycling lifetime of the solder joint. It was clarified that the tensile strength of the Sn-Sb binary alloy is proportional to the Sb content and the thermal cycling lifetime increases with increasing tensile strength of the solder. The precipitation strengthening of a SbSn compound leads to improvement of the tensile strength and thermal cycling lifetime.
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