干涉测量
光学
相位角(天文学)
相(物质)
视角
曲面(拓扑)
接受角
物理
量具(枪械)
平面(几何)
材料科学
几何学
数学
量子力学
液晶显示器
冶金
作者
B J Eves,Ian D. Leroux,A J Cen
出处
期刊:Metrologia
[IOP Publishing]
日期:2023-08-09
卷期号:60 (5): 055006-055006
被引量:7
标识
DOI:10.1088/1681-7575/acee82
摘要
Abstract A phase shifting Twymann-Green interferometer for the measurement of plane angle has been developed and characterized using a small-angle generator directly traceable to the definition of the radian. The impact of surface form on the measured angle was explored using a simple deformable mirror. The angle sensitivity of the interferometer did not depend upon the surface form. Comparison of the calibrations of two polygons and two angle gauge blocks by both the angle interferometer and a commercial autocollimator showed excellent agreement with normalized errors of less than 0.4. The standard uncertainty for the angle interferometer when measuring the polygons was less than 0.02.
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