扫描电化学显微镜
化学
基质(水族馆)
微电极
生物系统
动能
曲线拟合
显微镜
分辨率(逻辑)
分析化学(期刊)
电化学
电极
光学
人工智能
计算机科学
物理
色谱法
海洋学
物理化学
量子力学
机器学习
生物
地质学
作者
Sebastian Amland Skaanvik,Lisa I. Stephens,Samantha Michelle Gateman,Matthias Geißler,Janine Mauzeroll
标识
DOI:10.1021/acs.analchem.2c02498
摘要
Scanning electrochemical microscopy (SECM) has matured as a technique for studying local electrochemical processes. The feedback mode is most commonly used for extracting quantitative kinetic information. However, approaching individual regions of interest, as is commonly done, does not take full advantage of the spatial resolution that SECM has to offer. Moreover, fitting of experimental approach curves remains highly subjective due to the manner of estimating the tip-to-substrate distance. We address these issues using negative or positive feedback currents as a reference to calculate the tip-to-substrate distance directly for quantitative kinetic fitting of approach curves and line profiles. The method was first evaluated by fitting simulated data and then tested experimentally by resolving negative feedback and intermediate kinetics behavior in a spatially controlled fashion using (i) a flat, binary substrate composed of Au and SiO2 segments and (ii) a dual-mediator system for live-cell measurements. The methodology developed herein, named quantitative feedback referencing (QFR), improves fitting accuracy, removes fitting subjectivity, and avoids substrate–microelectrode contact.
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