An Implication of Spectral Interference of Lanthanum on Different Analytes for Their Determination in Lanthanum Matrix by CCD Detector-based ICP-AES

Lanthanum is found in relatively large quantities in the Earth's crust (32 ppm).Thus, there is a greater chance of La to be present in living systems, geological samples, and minerals.The presence of La even at trace amounts can interfere in the determination of other analytes in the samples.The present work is a systematic study of spectral interference caused by La on different analytes (Ag, Al, Ba, B, Bi, Ca, Cd, Co, Nd, Er, Pr, Lu, Ce, Dy, Eu, Sm, Cr, Cu, Fe, Ga, Gd, Mg, Mn, Na, Ni, Sr, Zn, and Pb) in order to establish the interference-free analytical lines for the analytes under investigation in a La matrix and using a highly sensitive capacitive coupled device (CCD) detector-based ICP-AES.A reliable method for trace level determination of these analytes without chemical separation is developed.The analytical performance (detection limit, sensitivity, etc.) and the correction factor were evaluated.The proposed method was validated by analyzing synthetic samples prepared for all of the analytes under study. EXPERIMENTAL Instrumentation and Operating ConditionsThe analysis was carried out using a Spectro-Arcos inductively coupled plasma atomic emission spectrometer (ICP-AES) (Spectro-Arcos, Germany), with argon plasma as the excitation source and