材料科学
钛酸钡
铁电性
扫描透射电子显微镜
透射电子显微镜
光电子学
光学
作者
Kaita Fukao,Yukio Sato,Ryo Teranishi,Kenji Kaneko
标识
DOI:10.7566/jpsj.90.034803
摘要
Scanning transmission electron microscopy (STEM) allows detailed atomic displacements in ferroelectrics to be studied. Although the interpretation of the displacements is straightforward for single...
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