激子
直线(几何图形)
谱线
物理
GSM演进的增强数据速率
原子物理学
材料科学
凝聚态物理
计算机科学
数学
量子力学
几何学
人工智能
作者
Ching‐Hwa Ho,P.C. Liao,Ying‐Sheng Huang,K. K. Tiong
出处
期刊:Physical review
日期:1997-06-15
卷期号:55 (23): 15608-15613
被引量:68
标识
DOI:10.1103/physrevb.55.15608
摘要
We have measured the temperature dependence of the spectral features in the vicinity of the direct gaps ${\mathrm{E}}_{\mathrm{g}}^{\mathrm{d}}$ of ${\mathrm{ReS}}_{2}$ and ${\mathrm{ReSe}}_{2}$ in the temperature range between 25 and 450 K using piezoreflectance (PzR). From a detailed line-shape fit to the PzR spectra we have been able to determine accurately the temperature dependence of the energies and broadening parameters of the band-edge excitons. The parameters that describe the temperature variation of the transition energies and broadening function have been evaluated.
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