材料科学
异质结
光电子学
二极管
极限(数学)
晶体管
范德瓦尔斯力
纳米技术
凝聚态物理
物理
量子力学
电压
数学分析
数学
分子
作者
Jakub Jadwiszczak,Jeffrey D. Sherman,David Lynall,Yang Liu,Boyan Penkov,Erik F. Young,Rachael Keneipp,Marija Drndić,James Hone,Kenneth L. Shepard
出处
期刊:ACS Nano
[American Chemical Society]
日期:2022-01-11
卷期号:16 (1): 1639-1648
被引量:30
标识
DOI:10.1021/acsnano.1c10524
摘要
Inverting a semiconducting channel is the basis of all field-effect transistors. In silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs), a gate dielectric mediates this inversion. Access to inversion layers may be granted by interfacing ultrathin low-dimensional semiconductors in heterojunctions to advance device downscaling. Here we demonstrate that monolayer molybdenum disulfide (MoS 2 ) can directly invert a single-walled semiconducting carbon nanotube (SWCNT) transistor channel without the need for a gate dielectric. We fabricate and study this atomically thin one-dimensional/two-dimensional (1D/2D) van der Waals heterojunction and employ it as the gate of a 1D heterojunction field-effect transistor (1D-HFET) channel. Gate control is based on modulating the conductance through the channel by forming a lateral p–n junction within the CNT itself. In addition, we observe a region of operation exhibiting a negative static resistance after significant gate tunneling current passes through the junction. Technology computer-aided design (TCAD) simulations confirm the role of minority carrier drift-diffusion in enabling this behavior. The resulting van der Waals transistor architecture thus has the dual characteristics of both field-effect and tunneling transistors, and it advances the downscaling of heterostructures beyond the limits of dangling bonds and epitaxial constraints faced by III–V semiconductors.
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