Accuracy in IV-measurement becomes more and more important as the production capacity of individual solar cell manufacturers will shortly exceed 1GWp. Therefore systematic error sources in the magnitude of less than 1% rel. need to be looked at more intensely. Due to reasons of comparability IV measurements shall be carried out according to the standards IEC 60904 at STC. Still these standards do not allow confining measurement conditions sufficiently in order to avoid all variations between different measurement setups. This work investigates established measurement setups with respect to possible systematic error sources being the impact of spectral mismatch and the contacting of the industrially produced solar cells.