分子内力
材料科学
化学物理
分辨率(逻辑)
分子
图像分辨率
纳米技术
原子单位
原子力显微镜
非接触原子力显微镜
导电原子力显微镜
分子物理学
化学
光学
物理
有机化学
人工智能
立体化学
量子力学
计算机科学
作者
Timothy M. Brown,Phil J. Blowey,Jack Henry,Adam Sweetman
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-01-05
卷期号:17 (2): 1298-1304
被引量:5
标识
DOI:10.1021/acsnano.2c09463
摘要
Acquisition of dense, three-dimensional, force fields with intramolecular resolution via noncontact atomic force microscopy (NC-AFM) has yielded enormous progress in our ability to characterize molecular and two-dimensional materials at the atomic scale. To date, intramolecular force mapping has been performed exclusively at cryogenic temperatures, due to the stability afforded by low temperature operation, and as the carbon monoxide functionalization of the metallic scanning probe tip, normally required for submolecular resolution, is only stable at low temperature. In this paper we show that high-resolution, three-dimensional force mapping of a single organic molecule is possible even at room temperature. The physical limitations of room temperature operation are overcome using semiconducting materials to inhibit molecular diffusion and create robust tip apexes, while challenges due to thermal drift are overcome with atom tracking based feedforward correction. Three-dimensional force maps comparable in spatial and force resolution to those acquired at low temperature are demonstrated, permitting a quantitative analysis of the adsorption induced changes in the geometry of the molecule at the picometer level.
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