Monte Carlo simulation and Gaussian broaden technique for full energy peak of characteristic X-ray in EDXRF

Background: Non-standard analysis(NSA) technique is one of the most important development directions of energy dispersive X-ray fluorescence(EDXRF).Purpose: This NSA technique is mainly based on Monte Carlo(MC) simulation and full energy peak broadening,which were studied preliminarily in this paper.Methods: A kind of MC model was established for Si-PIN based EDXRF setup,and the flux spectra were obtained for iron ore sample.Finally,the flux spectra were broadened by Gaussian broaden parameters calculated by a new method proposed in this paper,and the broadened spectra were compared with measured energy spectra.Results: MC method can be used to simulate EDXRF measurement,and can correct the matrix effects among elements automatically.Peak intensities can be obtained accurately by using the proposed Gaussian broaden technique.Conclusions: This study provided a key technique for EDXRF to achieve advanced NSA technology.