载流子寿命
超晶格
材料科学
导带
质子
辐射
红外线的
光电子学
光学
电子
物理
核物理学
硅
作者
Linda Höglund,David Z. Ting,Arezou Khoshakhlagh,Alexander Soibel,A. Fisher,Cory J. Hill,Sam A. Keo,Sir B. Rafol,Sarath D. Gunapala
摘要
Influence of proton radiation on the minority carrier lifetime and on carrier concentrations in InAs/InAsSb superlattices has been studied for radiation doses up to 300 krad. The lifetime decreased from 1.8 μs down to 430 ns as the dose was increased. A variation of the carrier concentration in the range 1–2 × 1015 with increasing radiation dose was observed. The lifetime drop was however mainly caused by added Shockley-Read-Hall defects in the material. The position of these Shockley-Read-Hall centers was estimated to ∼60 meV below the conduction band edge from comparison between calculated and measured temperature dependencies of the minority carrier lifetime.
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