单层
带隙
半导体
材料科学
密度泛函理论
混合功能
宽禁带半导体
光电子学
直接和间接带隙
纳米技术
计算化学
化学
作者
Yusuf Zuntu Abdullahi,R. Caglayan,A. Mogulkoc,Y. Mogulkoc,Fatih Ersan
出处
期刊:JPhys materials
[IOP Publishing]
日期:2023-03-02
卷期号:6 (2): 025003-025003
被引量:21
标识
DOI:10.1088/2515-7639/acc099
摘要
Abstract Ultrawide band gap materials have numerous potential applications in deep ultraviolet optoelectronics, as well as next-generation high-power and radio frequency electronics. Through the first-principles calculations based on density functional theory calculations, we demonstrate that the As 2 O 3 bulk and monolayer structures have excellent energetic, mechanical, and thermal stabilities. The bulk and monolayer of As 2 O 3 come in two distinct structures, namely st1-As 2 O 3 , and st2-As 2 O 3 . We show that the st1-As 2 O 3 and st2-As 2 O 3 monolayer and bilayer could be mechanically exfoliated from their bulk material and found that the cleavage energy values are significantly lower than those reported for similarly layered materials. By performing Perdew–Burke–Ernzerhof (PBE) and Heyd–Scuseria–Ernzerhof (HSE06) band structure calculations, we found that the bulk and monolayers of As 2 O 3 structures exhibit wide (PBE) and ultra-wide (HSE06) indirect band gaps. We further evaluate the As 2 O 3 layered thickness-dependent band gaps and found that band gap decreases uniformly as the number of st1-As 2 O 3 and st2-As 2 O 3 layers increases. Our findings demonstrate the potential of the As 2 O 3 structures for the future design of ultra-wide band gap semiconductor electronic devices.
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