材料科学
电介质
宽带
光学
相(物质)
对比度(视觉)
高对比度
相衬显微术
光电子学
物理
量子力学
作者
Ming Deng,Saima Kanwal,Zhuochao Wang,Chengkun Cai,Yongzhi Cheng,Jianguo Guan,Guangwei Hu,Jian Wang,Jing Wen,Lin Chen
出处
期刊:Nano Letters
[American Chemical Society]
日期:2024-11-06
卷期号:24 (46): 14641-14647
被引量:19
标识
DOI:10.1021/acs.nanolett.4c03695
摘要
The visualization of transparent specimens in traditional light microscopy is impeded by insufficient intrinsic contrast, prompting the development of advanced contrast-enhancement methodologies to transmute minute phase discrepancies into detectable amplitude alterations. While existing methods excel in either phase-contrast imaging (contrast-enhanced image of whole objects) or relief-like imaging (deceptive three-dimensional images), it would be of great significance to seamlessly integrate both capabilities in the same device. Here, we propose a novel metasurface-assisted half-side phase-contrast technique capable of simultaneous phase-contrast and relief-like imaging across the visible spectrum, which is realized by introducing a ±π/2 phase shift to a half-side diffracted wave emitted by the objects. Our method showcases successful application to diverse specimens, including a transparent silica disk and a frog egg cell. Our work substantiates high-quality microscopic imaging of various transparent specimens, which has profound implications in cellular biology, materials science, and medical diagnostics.
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