Advances in Atomic Force Microscopy for Probing Polymer Structure and Properties

Over the past 30 years, atomic force microscopy (AFM) has played an important role in elucidating the structure and properties of polymer surfaces. AFM-based techniques have enabled the quantitative determination of the physicochemical properties of polymer surfaces with high spatial resolution and under a wide variety of conditions. Coupled with the improvements in spatial and temporal resolution, multiparametric and multifunctional characterization has revealed the delicate interplay between structure, dynamics, and properties at the surfaces of complex systems. Here we summarize some of the significant advances that have been made in synthetic polymeric materials, most in the past 10 years, where AFM has been crucial, and we provide our perspective on where AFM will be insightful in future and instrumental in advancing emerging areas.