微透镜
灵敏度(控制系统)
材料科学
光学
计算机科学
物理
镜头(地质)
工程类
电子工程
作者
Robert Leitel,Peter Dannberg,Barbara Seise,Robert Brüning,Simon Grosse,Manuel Ligges
摘要
Single-photon avalanche diode (SPAD) sensors are versatile candidates for applications in low-light imaging and scenarios where high temporal resolution is crucial, like quantum imaging, fluorescence lifetime imaging, and (direct) time-of-flight methods. We demonstrate the improvement in light sensitivity by a factor of 7× for LiDAR (Light Detection and Ranging) by molding application-specific filling factor enhancing microlenses directly onto backside-illuminated SPADs. An 8"- wafer-level process is presented utilizing a mask aligner device for selective UV-curing of highly transparent polymer lenslets only in areas where SPADs are located and rinse uncured material from areas being compatible with postprocessing steps like chip dicing and electrical bonding. In addition to the optical benefits of chip-integrated lenslets, advantages arise from less system integration efforts of separately realized microlenses, especially with respect to tolerance conditions.
科研通智能强力驱动
Strongly Powered by AbleSci AI