Solar cell micro crack detection technique using electromechanical impedance and finite element analysis

Electromechanical impedance (EMI) is one of the modern techniques employed in the field of structural health monitoring (SHM) and has witnessed a great expansion in many domains due to its ability to ensure continuous monitoring and high reliability with a lower cost. Hence, the purpose of this study is to investigate the effectiveness of EMI in monitoring and detecting pre-existing cracks in the silicon layer of the photovoltaic (PV) solar cells. Indeed, a detailed finite element analysis (FEA) on the effect of piezoelectric lead zirconate titanate (PZT) patch shape on the EMI of crystalline-silicon (c-Si) layer of the PV solar cells were performed. The typical structure (c-Si + PZT) of different scenarios were stimulated by giving a lower voltage and high frequency as input data to extract the EMI signature as an explainable output result. Different models were investigated based on PZT patch types and crack position in the silicon layer. The results indicate that the EMI technique is effective in detecting crack, even in its incipient stage. The analysis suggests using a higher frequency range (350–650 kHz) for characterizing damage with an invisible depth due to the higher sensitivity of the EMI technique in this specific frequency.