材料科学
俄歇电子能谱
氧化锡
硫代硫酸盐
硫代硫酸钠
薄膜
水溶液
氧化物
电化学
无机化学
化学工程
沉积(地质)
电极
纳米技术
冶金
硫黄
化学
古生物学
物理化学
沉积物
工程类
生物
物理
核物理学
作者
Ashraf Abdel Haleem,Masaya Ichimura
标识
DOI:10.1016/j.matlet.2014.05.061
摘要
Aluminum oxide thin films were successfully deposited onto transparent conductive fluorine-doped tin oxide (FTO) glass for the first time through a facile single-step potentiostatic electrochemical deposition. The precursor solution was deionized water containing aluminum sulfate and sodium thiosulfate. The Auger electron spectroscopy, scanning electron spectroscopy, and optical transmission and thickness measurements were performed for the deposited films. The films are highly transparent, and O/Al composition ratio is nearly unity.
科研通智能强力驱动
Strongly Powered by AbleSci AI