氧化物
X射线光电子能谱
钌
卢瑟福背散射光谱法
金属
钛
材料科学
涂层
箔法
氧化钛
电极
无机化学
分析化学(期刊)
冶金
化学工程
化学
薄膜
纳米技术
复合材料
催化作用
物理化学
色谱法
工程类
生物化学
作者
Achille De Battisti,G. Lodi,Marcella Cappadonia,G. Battaglin,R. Kötz
摘要
Depth profiling of mixed oxide coatings supported on titanium foil, was performed by means of Rutherford backscattering spectrometry and x‐ray photoelectron spectroscopy. Results of the two techniques indicate the occurrence of surface segregation of the valve‐metal oxide and a general enrichment with it across the first 100–150 nm. The segregation phenomenon takes place for all of the coating compositions investigated. However, it seems less pronounced for Ru contents higher than 60 a/o. The nature of the ruthenium salt used in the coating preparation seems to affect the extent of the surface enrichment.
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