材料科学
溶解
解吸
分析化学(期刊)
辐照
扫描电子显微镜
热脱附光谱法
吸收(声学)
光刻胶
光谱学
化学工程
纳米技术
吸附
化学
有机化学
工程类
物理
复合材料
量子力学
核物理学
图层(电子)
作者
Nizan Kenane,Douglas A. Keszler
标识
DOI:10.1021/acsami.0c21942
摘要
Details of the chemistry enabling the patterning of organotin photoresists to single-digit-nm resolution continue to engage study. In this report, we examine the contributions of atmospheric gases to the differential dissolution rates of an n-butyltin oxide hydroxide photoresist. Cryo scanning tunneling electron microscopy (cryo-STEM) produces a micrograph of the latent image of an irradiated resist film, readily distinguishing exposed and unexposed regions. Temperature-programmed desorption mass spectrometry (TPD-MS) and cryo electron energy loss spectroscopy (cryo-EELS) show that irradiated films are depleted in carbon through desorption of butane and butene. Upon aging in air, irradiated films absorb H2O, as previously established. TPD-MS also reveals a previously unrecognized absorption of CO2, which correlates to a heightened dissolution contrast. This absorption may play an active role in determining intrinsic patterning performance and its variability based on changes in atmospheric-gas composition.
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