材料科学
X射线光电子能谱
溅射
溅射沉积
微观结构
铟
薄膜
分析化学(期刊)
光电子学
化学工程
纳米技术
复合材料
化学
色谱法
工程类
作者
Pei Lei,Xiaoting Chen,Yue Yan,Jingjing Peng,Changshan Hao,Jianchao Ji,Zhongqi Huo
出处
期刊:Vacuum
[Elsevier BV]
日期:2021-10-06
卷期号:195: 110645-110645
被引量:11
标识
DOI:10.1016/j.vacuum.2021.110645
摘要
Zinc-doped indium oxide (IZO) film, as an important transparent conductive oxide, has attracted increasing attention in various scientific and engineering areas. In the present work, discharge-voltage and reactive-oxygen controlled IZO films were grown by magnetron sputtering and studied systematically. The microstructure, element distribution and chemical bonding of IZO films were investigated by X-Ray diffraction (XRD), transmission electron microscope (TEM), Energy Dispersive X-Ray Spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS). The optical and electrical properties of IZO films were studied by controlled oxygen and discharge voltage. The typical microstructure of IZO films with optimal optical and electric properties has been characterized. High discharge voltage and matched oxygen vacancies could promote the low resistivity of IZO films, which could be determined by the electronic concentration and mobility.
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