佩多:嘘
薄膜
材料科学
极限抗拉强度
扫描电子显微镜
脆性
纳米
相对湿度
断裂(地质)
复合材料
纳米技术
聚合物
物理
热力学
作者
Udo Lang,Nicola Naujoks,Jürg Dual
出处
期刊:Synthetic Metals
[Elsevier BV]
日期:2008-12-31
卷期号:159 (5-6): 473-479
被引量:333
标识
DOI:10.1016/j.synthmet.2008.11.005
摘要
By tensile testing the mechanical properties of thin films of the intrinsically conductive poly(3,4-ethylenedioxythiophene) poly(styrene sulfonate) (PEDOT:PSS) under different relative humidities are investigated. It can be shown that the fracture behaviour strongly depends on humidity and reaches from brittle to plastic. The fracture surfaces are first investigated by scanning electron microscopy (SEM). The surfaces change from smooth at 23% rH to rough with shear lips for samples tested at 55% rH. Atomic force microscopy then reveals the topography of fracture surfaces at the nanometer scale and thus gives insights into the morphology of PEDOT:PSS thin films. By combining the experimental findings of the tensile tests and the AFM scans a micromechanical model for the deformation behavior of PEDOT:PSS can then be derived.
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