材料科学
二硫化钨
双层
角分辨光电子能谱
纳米-
放松(心理学)
钨
凝聚态物理
二硫键
结晶学
复合材料
电子结构
冶金
膜
物理
化学
生物
社会心理学
生物化学
遗传学
心理学
作者
Giovanna Feraco,Oreste De Luca,Przemysław Przybysz,Homayoun Jafari,Oleksandr Zheliuk,Ying Wang,Philip Schädlich,Pavel Dudin,J. Ávila,Jianting Ye,Thomas Seyller,P. Dąbrowski,P.J. Kowalczyk,Jagoda Sławińska,Petra Rudolf,Antonija Grubišić‐Čabo
标识
DOI:10.1103/physrevmaterials.8.124004
摘要
The diverse and intriguing phenomena observed in twisted bilayer systems, such as graphene and transition-metal dichalcogenides, prompted new questions about the emergent effects that they may host. However, the practical challenge of realizing these structures on a scale large enough for spectroscopic investigation, remains a significant hurdle, resulting in a scarcity of direct measurements of the electronic band structure of twisted transition metal dichalcogenide bilayers. Here, we present a systematic nanoscale angle-resolved photoemission spectroscopy investigation of bulk, single-layer, and twisted bilayer WS2 with a small twist angle of 4.4∘. The experimental results are compared with theoretical calculations based on density functional theory along the high-symmetry directions Γ¯-K̄ and Γ¯-M¯. Surprisingly, the electronic band structure measurements suggest a structural relaxation occurring at 4.4∘ twist angle and the formation of large, untwisted bilayer regions replacing most of the twisted area.
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