材料科学
半导体
带隙
分光计
光电子学
纳米技术
工程物理
光学
物理
作者
Gongyuan Zhang,Ma Zhi,Hao Cui,Pan Wang,Feng Tang,Xin Ye,Rong Xiang,Bing‐Feng Ju,Hui‐Liang Shen,Shurong Dong,Jikui Luo,Qi Jie Wang,Shilong Pan,Ang Li,Zongyin Yang
标识
DOI:10.1002/adom.202402935
摘要
Abstract Spectrometers are vital analytical tools for measuring light spectra, crucial for applications ranging from environmental monitoring to biomedical diagnostics. A significant challenge in the miniaturization of these instruments is achieving efficient light dispersion in confined spaces. Traditional dispersion elements, such as gratings and prisms, require precise geometrical arrangements, rendering them unsuitable for compact designs. This study introduces a novel approach to light dispersion utilizing a bandgap‐graded semiconductor film, synthesized through a streamlined material preparation process. The film's intrinsic transmission properties enable effective light dispersion without the limitations imposed by optical interference, making it ideal for integration into miniaturized optical devices. The practical application of this technology is demonstrated through the development of a compact spectrometer capable of large‐field and microscopic spectral imaging. The investigation into light dispersion in engineered materials sets a new paradigm and lays the foundation for the design of optical systems.
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