模具(集成电路)
薄脆饼
限制
晶片键合
激光器
材料科学
纳米技术
光电子学
机械工程
物理
工程类
光学
作者
Koen Kennes,Alain Phommahaxay,Alice Guerrero,Olga Bauder,Samuel Suhard,Pieter Bex,Serena Iacovo,Xiao Liu,Thomas Schmidt,Gerald Beyer,Eric Beyne
标识
DOI:10.1109/ectc32862.2020.00056
摘要
Current roadblocks within the collective die-to-wafer bonding flow, limiting die-transfer yield and throughput, are identified and discussed. Based on the obtained assessment a new carrier system is introduced. The use of the ultra-soft and highly-UV-transparent BrewerBOND ® C1301 material and its compatibility with BrewerBOND ® 701 laser release material, which is coated on top of ultra-thin dies, allows for a room temperature, ultra-low force collective bonding with laser-assisted die transfer sequence.
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