超细纤维
材料科学
三元运算
折射率
铜
检出限
光纤传感器
干涉测量
离子
光学
干扰(通信)
光电子学
分析化学(期刊)
纤维
复合材料
色谱法
化学
频道(广播)
工程类
物理
电气工程
有机化学
冶金
计算机科学
程序设计语言
作者
Jiguang Chen,Dandan Sun,Shaomin Xu,Yongming Fu,Yukun Yang,Jie Ma
标识
DOI:10.1002/admi.202200491
摘要
Abstract An optic‐fiber sensor for detecting the concentration of trace copper ions is proposed using a ternary cross‐linked sensitive film coated on the Mach–Zehnder microfiber interferometer surface. The microfiber has a huge evanescent field offering high sensitivity to the ambient refractive index. The chelation between imidazole groups in the coated thin film and copper ions changes the refractive index of the sensor surface, which is converted into macroscopic wavelength drift in the interference spectrum. The sensitivity of the sensor is up to 7.715 × 10 6 nm M −1 with the detection limit of 0.0576 ppm. This sensor can effectively avoid the effect of temperature cross‐response and has good specificity and stability. This study has instructive meanings for designing optical pollutant sensors with high stability and improved detection accuracy in a potentially multi‐characteristic environment.
科研通智能强力驱动
Strongly Powered by AbleSci AI