火炬
微波食品加热
等离子体
等离子炬
体积流量
分析化学(期刊)
物理
傅里叶变换红外光谱
红外线的
光学
化学
材料科学
机械
环境化学
核物理学
冶金
量子力学
焊接
作者
Yong Cheol Hong,Han S. Uhm,Byung Jun Chun,Sun Ku Lee,Sang Kyu Hwang,Dong Su Kim
摘要
An atmospheric pressure microwave plasma torch as a tool for fluorinated compounds (FCs) abatement was presented. Detailed experiments were conducted on the abatement of NF3 and SF6 in terms of destruction and removal efficiency (DRE) using Fourier transform infrared (FTIR). Swirl gas, compressed air for stable plasma, was tangentially injected into the microwave plasma torch and a mixture of N2, NF3, or SF6, and C2H4 was axially injected. The DRE of 99.1% for NF3 was achieved without an additive gas at the total flow rate of 50.1 liters per minute (lpm) by applying a microwave power of 1.4kW. Also, a DRE of SF6 up to 90.1% was obtained at the total flow rate of 40.6lpm using an applied microwave power of 1.4kW. Experimental results indicate that the microwave plasma abatement device can successfully eliminate FCs in the semiconductor industry.
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