Strengthening mechanisms of Cu/SACZ/Al micro-connection joints with solid-state bonding

连接(主束) 材料科学 固态 复合材料 结构工程 法律工程学 冶金 机械工程 工程物理 工程类
作者
Guisheng Gan,Hao Yang,Jie Luo,Yongchong Ma,Jiajun Zhang,Xin Liu,He Qiao,Leqi Li,Dayong Cheng
出处
期刊:Microelectronics International [Emerald Publishing Limited]
标识
DOI:10.1108/mi-08-2024-0260
摘要

Purpose The purpose of this study was to investigate the effects of aging time on the microstructure, mechanical properties and fracture morphology of Cu/Zn160%SAC0307/Al solder joints produced through solid-state bonding. Design/methodology/approach Zn particles with a size of 1 µm and Sn-0.3Ag-0.7Cu (SAC0307) particles ranging from 20 to 38 µm were used to achieve Cu/Al micro-connections using ultrasonic assistance at a temperature of 180 °C, followed by aging treatment at 150 °C to enhance the quality of Cu/Al joints. Scanning electron microscopy was used for observing and analyzing the solder seam, interface microstructure, and fracture morphology. The structural composition was determined using energy dispersive spectroscopy, while a PTR-1102 bonding tester was used to measure the average shear strength. Findings The results indicated that the intermetallic compounds formed at the interface between Cu substrates and solder metal primarily consisted of smooth Cu5Zn8. The Al-side interface mainly comprises an Al-Sn-Zn solid solution, with Zn-Sn-Cu phases forming between SAC0307 particles at 180 °C. During the aging process, atomic diffusion was accelerated, leading to improved connection quality. The shear strength of the joints initially increased before decreasing as aging time progressed; it peaked at 32.92 MPa after 24 h – an increase of 76.8% compared to as-received joints. After reaching stability at 96 h, there was still a notable increase in shear strength by 48.4% relative to as-received joints. Originality/value This study further explores the strengthening mechanisms associated with solid-state bonded Cu/SACZ/Al joints through aging processes. Joints created via solid-state bonding demonstrate superior reliability compared to traditional soldered connections. It is anticipated that insights gained from this research will contribute valuable knowledge toward developing low-temperature soldering methodologies for heterogeneous materials.
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