材料科学
薄膜
兴奋剂
氧化铟锡
等离子体
带隙
薄板电阻
表面粗糙度
铟
氧化物
工作职能
光电子学
化学工程
纳米技术
图层(电子)
复合材料
冶金
物理
工程类
量子力学
作者
Young-Hee Joo,Doo‐Seung Um,Chang-Il Kim
标识
DOI:10.1088/2053-1591/ac3f0a
摘要
Abstract Al-doped ZnO (AZO) is a promising transparent conducting oxide that can replace indium tin oxide (ITO) owing to its excellent flexibility and eco-friendly characteristics. However, it is difficult to immediately replace ITO with AZO because of the difference in their physical properties. Here, we study the changes in the physical properties of AZO thin films using Ar and O 2 plasma treatments. Ar plasma treatment causes the changes in the surface and physical properties of the AZO thin film. The surface roughness of the AZO thin film decreases, the work function and bandgap slightly increase, and the sheet resistance significantly decreases. In contrast, a large work function change is observed in the AZO thin film treated with O 2 plasma; however, the change in other characteristics is not significant. Therefore, the results indicate that post-treatment using plasma can accelerate the development of high-performance transparent devices.
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