Electromagnetic Conductive Immunity of a Microcontroller by Direct Power Injection

This paper deals with direct power injection (DPI) test research and its fabrication of test circuit board, construction of test system, and failure analysis. Such a sensitivity test aims to assist designers in assessing the IC's (integrated circuits) susceptibility to radio frequency interferences (RFI) during the design phase of the IC. The IEC 62132-4 standard method of immunity measurement is applied to a microcontroller chip to evaluate the sensitivity of specific pins to direct power injection conducted interference. Through experiments, get the sensitive threshold and interference amplitude of the microcontroller. And through the optical microscope and scanning electron microscope to explore the reasons for the failure of the microcontroller, the main damage mechanism is thermal stress.