Efficient multi-V<inf>T</inf> FDSOI technology with UTBOX for low power circuit design
计算机科学
作者
C. Fenouillet-Béranger,Olivier Thomas,P. Perreau,J-P. Noel,A. Bajolet,S. Haendler,L. Tosti,S. Barnola,R. Beneyton,C. Perrot,C. de Buttet,F. Abbate,Filipp A. Baron,B. Pernet,Y. Campidelli,L. Pinzelli,P. Gouraud,M. Cassé,C. Borowiak,O. Weber
出处
期刊:Symposium on VLSI Technology日期:2010-06-01被引量:62
标识
DOI:10.1109/vlsit.2010.5556118
摘要
For the first time, Multi-V T UTBOX-FDSOI technology for low power applications is demonstrated. We highlight the effectiveness of back biasing for short devices in order to achieve I ON current improvement by 45% for LVT options at an I OFF current of 23nA/µm and a leakage reduction by 2 decades for the HVT one. In addition, fully functional 0.299um 2 bitcells with 290mV SNM at 1.1V and Vb=0V operation were obtained. We also demonstrate on ring oscillators and 0.299µm 2 SRAM bitcells the effectiveness (ΔV T versus V b ∼ 208mV/V) of the conventional bulk reverse and forward back biasing approaches to manage the circuit static power and the dynamic performances.