串联
欧姆接触
二极管
材料科学
开路电压
钙钛矿(结构)
肖特基二极管
光电子学
硅
香料
电压
短路
晶体硅
计算物理学
电子工程
纳米技术
电气工程
化学
物理
结晶学
工程类
复合材料
图层(电子)
作者
Yuheng Zeng,Zetao Ding,Zunke Liu,Wei Liu,Mingdun Liao,Xi Yang,Zhiqin Ying,Jingsong Sun,Jiang Sheng,Baojie Yan,Haiyan He,Chunhui Shou,Zhenhai Yang,Jichun Ye
标识
DOI:10.1088/1674-4926/44/8/082702
摘要
Abstract In this work, we developed a simple and direct circuit model with a dual two-diode model that can be solved by a SPICE numerical simulation to comprehensively describe the monolithic perovskite/crystalline silicon (PVS/c-Si) tandem solar cells. We are able to reveal the effects of different efficiency-loss mechanisms based on the illuminated current density-voltage ( J - V ), semi-log dark J - V , and local ideality factor ( m - V ) curves. The effects of the individual efficiency-loss mechanism on the tandem cell’s efficiency are discussed, including the exp( V / V T ) and exp( V /2 V T ) recombination, the whole cell’s and subcell’s shunts, and the Ohmic-contact or Schottky-contact of the intermediate junction. We can also fit a practical J - V curve and find a specific group of parameters by the trial-and-error method. Although the fitted parameters are not a unique solution, they are valuable clues for identifying the efficiency loss with the aid of the cell’s structure and experimental processes. This method can also serve as an open platform for analyzing other tandem solar cells by substituting the corresponding circuit models. In summary, we developed a simple and effective methodology to diagnose the efficiency-loss source of a monolithic PVS/c-Si tandem cell, which is helpful to researchers who wish to adopt the proper approaches to improve their solar cells.
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