神经形态工程学
记忆电阻器
材料科学
超短脉冲
光电子学
冯·诺依曼建筑
电阻随机存取存储器
人工神经网络
测距
高效能源利用
纳米技术
无定形固体
铟
电阻式触摸屏
卷积神经网络
电子工程
电压
能量转换
转化(遗传学)
能量转换效率
硒化物
功率(物理)
紫外线
电致变色
硫系化合物
计算机科学
纳米电子学
能量(信号处理)
工程物理
电效率
理论(学习稳定性)
切换时间
氧化铟锡
纳米晶
作者
Genwang Wang,Sifan Li,Caokun Wang,Yun Ji,Mei Er Pam,Ye Ding,Lijun Yang,Kah‐Wee Ang
标识
DOI:10.1002/adfm.202516141
摘要
Abstract 2D materials provide a versatile platform for developing memristor‐based in‐memory computing systems, with potential to address some limitations of conventional von Neumann architectures. However, meeting the stringent requirements for precision, stability, and energy efficiency in neural network hardware remains a challenge due to the intrinsic properties of many 2D materials. In this work, a controllable ultraviolet ozone (UVO) treatment is introduced to engineer the properties of 2D indium selenide (InSe) by introducing a tailored combination of defects, amorphous regions, and oxidized phases. This modification improves the structural stability and vertical conductivity of InSe, and promotes ion migration, enabling a transition from non‐switching to stable nonvolatile resistive switching (RS) behavior. The resulting memristors exhibit uniform RS characteristics, with low variability in switching voltage (5.8%) and a tunable on/off ratio ranging from 10 2 to 10 5 . In addition, the devices demonstrate sub‐20 ns switching speeds and can emulate artificial neural networks (ANNs) with recognition accuracy comparable to software‐based implementations. Hardware‐based convolutional image processing with improved power efficiency is further demonstrated, underscoring the potential of UVO‐InSe memristors for energy‐efficient neuromorphic computing applications.
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