材料科学
溅射
电阻率和电导率
电导率
电解质
基质(水族馆)
离子电导率
分析化学(期刊)
光电子学
薄膜
纳米技术
电极
电气工程
化学
海洋学
物理化学
色谱法
地质学
工程类
作者
Brecht Put,Philippe M. Vereecken,Johan Meersschaut,Mauricio Sepúlveda,Andre Stesmans
标识
DOI:10.1021/acsami.5b12500
摘要
Ultrathin lithium phosphorus oxynitride glass (LiPON) films with thicknesses down to 15 nm, deposited by reactive sputtering in nitrogen plasma, were found to be electronically insulating. Such ultrathin electrolyte layers could lead to high power outputs and increased battery energy densities. The effects of stoichiometry, film thickness, and substrate material on the ionic conductivity were investigated. As the amount of nitrogen in the layers increased, the activation energy of the ionic conductivity decreased from 0.63 to 0.53 eV, leading to a maximum conductivity of 1 × 10–6 S/cm. No dependence of the ionic conductivity on the film thickness or substrate material could be established. A detailed analysis of the equivalent circuit model used to fit the impedance data is provided. Polarization measurements were performed to determine the electronic leakage in these ultrathin films. A 15-nm LiPON layer on a TiN substrate showed electronically insulating properties with electronic resistivity values around 1015 Ω·cm. To our knowledge, this is the thinnest RF-sputtered LiPON layer shown to be electronically insulating while retaining good ionic conductivity.
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