电容
光电探测器
硅
光电子学
材料科学
电气工程
物理
电极
工程类
量子力学
作者
Wolfgang Gaberl,Horst Zimmermann
标识
DOI:10.1109/group4.2006.1708186
摘要
Results of a low capacitance design for integrated silicon photodiodes are presented. The diodes use n + -doped finger cathodes as well as p + -fingers. With this design it is possible to lower the capacitance compared to homogenous photodiodes (vertical PIN photodiode structure). Low capacitances are reached even at low bias voltages of around 2 V. The diodes reach a responsivity of R=0.24A/W (0.45A/W) at a wavelength of 410 nm (660 nm). The diode design aims at applications where maximum sensitivity, i.e. lowest noise, and therefore low photodiode capacitance is needed. The photodiodes were realized in a 0.6mum BiCMOS process
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