Study of the Secondary Electron Emission Suppression of TiN Coating on Polyimide Film Material

Polyimide materials (PIs) are extensively used in aerospace applications due to their superior mechanical and thermal properties. However, their high secondary electron emission yield (SEY) poses significant challenges. To decrease the SEY of material, this study employed the magnetron sputtering technique to deposit TiN coatings of varying thicknesses onto PI surface. The results indicated that TiN coatings significantly reduced the secondary electron emission (SEE) of PI materials. Specifically, a 400‐nm TiN coating decreased the maximum SEY from 1.72 to 1.07. The results demonstrate that TiN coatings are effective in suppressing SEE, thereby indicating their considerable potential for aerospace technological applications.