聚酰亚胺
材料科学
高分子化学
聚合物
电介质
复合材料
聚合物混合物
乙醚
介电强度
亚苯基
酰亚胺
化学
有机化学
光电子学
共聚物
图层(电子)
作者
Qiyan Zhang,Xin Chen,Bing Zhang,Tian Zhang,Wengchang Lu,Zhe Chen,Ziyu Liu,Seong H. Kim,Brian F. Donovan,Ronald J. Warzoha,Enrique D. Gomez,J. Bernholc,Qi Zhang
出处
期刊:Matter
[Elsevier]
日期:2021-07-01
卷期号:4 (7): 2448-2459
被引量:118
标识
DOI:10.1016/j.matt.2021.04.026
摘要
Polymers with high dielectric breakdown strength (Eb) over a broad temperature range are vital for many applications. The presence of weak points, such as voids and free volume, severely limit the Eb of many high-temperature polymers. Here, we present a general strategy to reduce these weak points by exploiting interchain electrostatic forces in polymer blends. We show that the strong interchain electrostatic interaction between two high-temperature polymers in blends of polyimide (PI) with poly(ether imide) (PEI) yields an extended polymer chain conformation, resulting in dense chain packing and a corresponding decrease in weak spots in the polymers. This leads to a greater than 65% enhancement of Eb at room temperature and 35% enhancement at 200°C. In conjunction with results from blends of PI/poly(1,4-phenylene ether-sulfone) (PSU) and blends of PEI/PSU, we show that this previously unexplored molecular engineering strategy is efficient and straightforward in minimizing weak points in dielectric polymers.
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