X射线光电子能谱
表征(材料科学)
俄歇电子能谱
质谱法
材料科学
二次离子质谱法
氧化物
分析化学(期刊)
电子光谱学
化学状态
辉光放电
静态二次离子质谱
纳米技术
冶金
化学
化学工程
环境化学
工程类
物理
等离子体
核物理学
量子力学
色谱法
标识
DOI:10.2355/tetsutohagane1955.82.7_551
摘要
Surface analysis methods, such as Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, glow discharge optical emission spectrometry and so on, have become indispensable to characterize surface and interface of many kinds of steel. Although a number of studies on characterization of steel by these methods have been carried out, several problems still remain in quantification and depth profiling. Nevertheless, the methods have provided essential information on the concentration and chemical state of elements at the surface and interface. Recent results on characterization of oxide layers, coated films, etc. on the surface of steel are reviewed here.
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