兴奋剂
X射线光电子能谱
材料科学
溅射
氧气
电阻率和电导率
基质(水族馆)
薄膜
金属
分析化学(期刊)
电导率
霍尔效应
溅射沉积
化学工程
化学
纳米技术
物理化学
冶金
光电子学
海洋学
电气工程
有机化学
色谱法
地质学
工程类
作者
Ann-Katrin Emmerich,Kim Alexander Creutz,Yaw-Yeu Cheng,Jean-Christophe Jaud,Andreas H. Hubmann,Andreas Klein
摘要
Ti-doped In2O3 thin films with varying Ti contents are prepared by partial reactive co-sputtering using ceramic In2O3 and metallic Ti targets and characterized by in situ x-ray photoelectron spectroscopy, electrical conductivity, and Hall-effect measurements. For a substrate temperature of 400°C, the carrier concentration increases faster than the Ti content and saturates at ≈7.4×1020cm−3. Based on these results, it is suggested that Ti does not directly act as donor in In2O3 but is rather forming TiO2 precipitates and that the related scavenging of oxygen generates oxygen vacancies in In2O3 as origin of doping. Neutralization of oxygen vacancies is, therefore, suggested to be origin of the limitation of the carrier concentration in Ti-doped In2O3 films.
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