异质结
光电子学
材料科学
光敏性
光电探测器
单色
带隙
量子阱
光学
物理
激光器
作者
G. A. Sukach,П. С. Смертенко,L. G. Shepel,R. Ciach,M. Kuźma
标识
DOI:10.1016/s0038-1101(02)00418-5
摘要
We fabricated selective photodetectors on the basis of graded-gap GaAlAs/GaAs heterostructures and quantum-confined GaInN/GaN structures. At λ=λmax the monochromatic photosensitivity is in the range of 0.1–0.7 A/W (GaAlAs/GaAs), 0.15 A/W (GaInN/GaN). The methods are developed for control over the photosensitivity band width and its energy position in the 0.35–1.1 μm by varying technological factors (such as gap gradient, spacing between the metallurgical boundary and p–n junction, minority charge carrier diffusion length).
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