材料科学
退火(玻璃)
微波食品加热
拉曼光谱
形成气体
陶瓷
电介质
氢
氧气
烧结
电导率
介电损耗
分析化学(期刊)
复合材料
光电子学
光学
化学
物理化学
色谱法
有机化学
物理
量子力学
作者
N. Sezer,Ece Tuğba Saka
标识
DOI:10.1142/s0217979216500302
摘要
The effect of H 2 forming gas annealing on the microwave properties of [Formula: see text] (BZT) dielectric ceramics has been studied. The structural, microwave, DC electrical and optical properties were analyzed by experiment results. With elevated temperature annealing, the microwave loss of BZT was increased. This trend correlated with high DC conductivity of annealed samples, as well as dampened phonons found in Raman spectra. These evidences, together, prove that the enhancement of oxygen vacancy defects induced by oxygen deficient sintering environment is one of the main extrinsic root causes for the high microwave loss in practical ceramic materials.
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