材料科学
微电子
纳米技术
蚀刻(微加工)
纳米光刻
导电体
光电子学
薄膜
干法蚀刻
电极
各向同性腐蚀
可扩展性
反应离子刻蚀
纳米电子学
电导率
电阻率和电导率
分辨率(逻辑)
制作
纳米制造
高分辨率
过程(计算)
作者
Bar Favelukis,Barak Ratzker,Yonatan Juhl,Noy Stein Chneider,Omer Ashuach,Avia Greenberg,Jürgen Jopp,Pini Shekhter,Maxim Sokol
出处
期刊:Nano Letters
[American Chemical Society]
日期:2025-09-15
卷期号:25 (38): 14017-14024
被引量:5
标识
DOI:10.1021/acs.nanolett.5c02975
摘要
High Resolution Image Download MS PowerPoint Slide The integration of MXenes, a class of conductive two-dimensional materials, into the microelectronics industry is largely hindered by the lack of scalable patterning methods. Herein, we present a novel wet etching approach for Ti 3 C 2 T z MXene micropatterning, offering a facile, clean, cost-effective, and highly controllable technique that preserves the MXene intrinsic electrical and structural properties. By tailoring the etching solution and process parameters, micropatterned MXene electrodes with ∼200 nm lateral resolution were produced. The patterned films were applied to functional devices, including metal–semiconductor−metal (MSM) photodetectors, which demonstrated high conductivity and enhanced photoresponsivity. This work represents the first demonstration of wet etching as a viable method for highly precise MXene patterning, providing a scalable solution for next-generation MXene-based microelectronic technologies.
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