消色差透镜
光学
螺旋(铁路)
炸薯条
CMOS芯片
对比度(视觉)
相(物质)
相位对比成像
相衬显微术
材料科学
物理
光电子学
计算机科学
工程类
电信
机械工程
量子力学
作者
Xinghao Wang,Chaowei Wang,Jincheng Ni,Shunli Liu,Hao Wu,Tao Yuan,Yusheng Jin,Xianglong Wang,Jiawen Li,Yanlei Hu,Jiaru Chu,Shih‐Chi Chen,Haoran Ren,Dong Wu
标识
DOI:10.1002/lpor.202500239
摘要
Abstract Spiral phase contrast (SPC) imaging, renowned for its label‐free imaging capabilities, has garnered great attention in microscopy, biomedical science, and material science. Despite the adoption of ultrathin metasurfaces as substitutes for conventional SPC optical components, the overall optical systems remain bulky and suffer from chromatic aberration owing to the light dispersion. Here, an ultracompact achromatic SPC imager (UASI) integrated onto a complementary metal‐oxide‐semiconductor chip is presented. The UASI combines vertically integrated refractive and diffractive optical elements, including a refractive microlens for high‐resolution imaging and a diffractive spiral microlens to compensate for chromatic aberration, thereby achieving achromatic SPC imaging. This UASI, fabricated by 3D direct laser writing, realizes edge‐enhanced imaging with high efficiency (≈60%) under broadband light illumination (450–660 nm). The demonstration paves the way for the utilization of hybrid micro‐optics in advanced imaging, providing an ultracompact achromatic solution for edge‐enhanced imaging, object recognition, biomedical, and material science applications.
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