化学
卤化物
X射线光电子能谱
腐蚀
环境压力
X射线
铅(地质)
光谱学
无机化学
化学工程
光学
有机化学
热力学
物理
量子力学
地貌学
工程类
地质学
作者
Michel De Keersmaecker,Paul Dietrich,Mounib Bahri,Nigel D. Browning,Neal R. Armstrong,Erin L. Ratcliff
摘要
/light catalyst is removed, postulated to be due to mobile halide species present within the film below XPS sampling depth. Small deviations in near-surface composition (<2%) of the perovskite are used to connect reaction rates to quantified, near-band edge donor and acceptor defect concentrations, demonstrating two energetically distinct sites are responsible for the redox process. Collectively, environmental flux and rate quantification are deemed critical for the future elucidation of chemical degradation processes in perovskites, where rate-dependent reaction pathways are expected to be very system dependent (environment and material).
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