Raman Measurements as a Fast and Efficient Technique for Characterisation of TiO2 and Quantum Dots on TiO2 Substrate for Photovoltaic Application

In this work we focus on the characterization methods allowing fast, cheap, and easy identification of photoanode TiO2 layer as well as quantum dots on the TiO2 surface for photovoltaic application.Application of the colloidal quantum dots material for the production of quantum dots solar cell is a key issue for mass production.At the same time there is a demand for a method to control the production steps for the deposition process for both photoanode and nanomaterial.The method has to be fast and cheap as well as efficient in order to meet the requirements imposed by production processes.For this purpose we propose to use a micro Raman spectroscopy as an efficient method to verify the presence of QDs.In this work we compare the results obtained by scanning electron microscopy with the Raman spectroscopy in theme of the pros and cons of these techniques.