纳米线
材料科学
光电子学
晶体管
等效氧化层厚度
场效应晶体管
电介质
MOSFET
泄漏(经济)
逻辑门
热的
栅极电介质
高-κ电介质
纳米技术
栅氧化层
电气工程
电压
工程类
物理
气象学
经济
宏观经济学
作者
Young Suh Song,Sangwan Kim,Garam Kim,Hyunwoo Kim,Jongho Lee,Jang Hyun Kim,Byung‐Gook Park
标识
DOI:10.35848/1347-4065/abec5c
摘要
Abstract For improving self-heating effect (SHE) in Ge vertically stacked gate-all-around (GAA) nanowire (NW) p-type metal-oxide-semiconductor field-effect transistor (pMOSFET), aluminum oxide (Al 2 O 3 , alumina) is utilized for gate dielectric layer. From the high thermal conductivity of Al 2 O 3 , SHE is significantly improved. In order to validate the proposed device structure, technology computer-aided design simulation is performed through Synopsys Sentaurus three-dimensional tool. As a result, when Al 2 O 3 is incorporated in Ge vertically stacked GAA NW pMOSFET, SHE can be remarkably improved from 534 to 419 K. In addition, the method of simultaneously accomplishing improvement of SHE and low gate leakage current ( I gate ) have been specifically investigated and proposed with numerous simulation data.
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