热离子发射
阴极
场电子发射
扫描电子显微镜
肖特基二极管
材料科学
光电子学
肖特基效应
阴极射线
电子束感应电流
光学
电子
次级电子
二极管
电气工程
物理
复合材料
工程类
量子力学
标识
DOI:10.1111/j.1365-2818.1985.tb02684.x
摘要
SUMMARY Low voltage scanning electron microscopy is a technique of great importance to the semiconductor industry, where inspection and testing of non‐conductive devices must be done at ∼ 1 keV beam energy. In order to perform scanning electron microscopy for inspection at high speed, improved cathodes are required in order to achieve good resolution at low energy with high beam current, the chromatic spread in the electron beam is shown to be the limiting factor in the SEM and a comparison of thermionic, field emission and Schottky cathodes is made to determine which can provide the best performance. It is concluded that a thermal field emission or Schottky, cathode is superior to either conventional field emission or thermionic cathodes.
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